Automated optical SMT inspection-Bare PCB inspection

- Mar 04, 2017-

Automated optical SMT inspection-Bare

PCB inspection

Automated optical inspection

Automated optical inspection (AOI) is an automated visual inspection of printed circuit board (PCB) (or LCDtransistor) manufacture where a camera autonomously scans the device under test for both catastrophic failure (e.g. missing component) and quality defects (e.g. fillet size or shape or component skew). It is commonly used in the manufacturing process because it is a non-contact test method. It is implemented at many stages through the manufacturing process including bare board inspection, solder paste inspection (SPI), pre-reflow and post-reflow as well as other stages.

SMT inspection

AOIs for a PCB board with components may inspect the following features:

  • Area defects

  • Billboarding

  • Component offset

  • Component polarity

  • Component presence or absence

  • Component Skew

  • Excessive Solder Joints

  • Flipped component

  • Height Defects

  • Insufficient Paste around Leads

  • Insufficient Solder Joints

  • Lifted Leads

  • No Population tests

  • Paste Registration

  • Severely Damaged Components

  • Solder Bridges

  • Tombstoning

  • Volume Defects

  • Wrong Part

  • Bridging

AOI can be used in the following locations in the SMT lines: post paste, pre-reflow, post-reflow, or wave areas.

Bare PCB inspection

AOI for a bare PCB board inspection may detect these features:

  • Line width violations

  • Spacing violation

  • Excess copper

  • Missing pad – a feature that should be on the board is missing

  • Short circuits

  • Cuts

  • Hole breakage – a drilled hole (via) is outside of its landing pad

  • Wrong mounting components identified

The triggering of a defects report may be either rule based (e.g. no lines on the board should be smaller than 50μ) or CAD based in which the board is locally compared with the intended design.

This inspection is much more reliable and repeatable than manual visual inspection.

In many cases, smaller circuit board designs are driving up the demand for AOI vs in-circuit testing.


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